Journal of Electron Spectroscopy and Related Phenomena
Brief Name:
J ELECTRON SPECTROSC
Impact factor:
1.8 (2023)
ISSN:
0368-2048
Home Page:
Open Access:
No
Publisher:
Elsevier B.V.
Publication Frequency:
Monthly
Article Processing Charge:
$3080
Publication Start Year:
1972
Annual Articles:
74
Self-citation Rate:
5.6%
Chinese Academy of Sciences SCI Journal Classification:
| Major category | Ｍinor category | TOP journal | Ｒeview journal |
|---|---|---|---|
Q4 PHYSICAL |
SPECTROSCOPY | No | No |
Subject Classification:
SPECTROSCOPY
CiteScore:
| CiteScore | SJR | SNIP | CiteScore ranking | ||||||
|---|---|---|---|---|---|---|---|---|---|
| 3.3 | 0.506 | 0.68 |
|
H-Index:
80
SCI Index Status:
Science Citation Index Expanded
Official Review Time:
Review time: 105days
Submission to acceptance: 115days
Acceptance to publication: 11days
PubMed Central:
Submission Site:
Aims and Scope:
The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.
The journal encourages contributions in the general area of atomic, molecular, ionic, liquid and solid state spectroscopy carried out using electron impact, synchrotron radiation (including free electron lasers) and short wavelength lasers. Papers using photoemission and other techniques, in which synchrotron radiation, Free Electron Lasers, laboratory lasers or other sources of ionizing radiation, combined with electron velocity analysis are especially welcome. The materials properties addressed include characterization of ground and excited state properties as well as time resolved electron dynamics.
The individual techniques of electron spectroscopy include photoelectron spectroscopy of both outer and inner shells; inverse photoemission; spin-polarised photoemission; time resolved 2-photon photoemission, resonant and non-resonant Auger spectroscopy including ion neutralization studies; edge techniques (EXAFS, NEXAFS,...) , resonant and non-resonant inelastic X-ray scattering (RIXS), spectro-microscopy, high resolution electron energy loss spectroscopy; electron scattering and resonance electron capture; electron spectroscopy in conjunction with microscopy; penning ionization spectroscopy including scanning tunneling spectroscopy; theoretical treatments of the photoemission, X-ray emission, Auger, energy loss and Penning ionization processes. Contributions on instrumentation and technique development, date acquisition - analysis - quantification are also welcome.
Subject areas covered include spectroscopic characterization of materials and processes concerning:
- surfaces, interfaces, and thin films;
- atomic and molecular physics, clusters;
- semiconductor physics and chemistry;
- materials for photovoltaics;
- materials science including: metal surfaces, nanoparticles, ceramics, strongly correlated systems, polymers, biomaterials and other organic films;
- catalysis
The journal encourages contributions in the general area of atomic, molecular, ionic, liquid and solid state spectroscopy carried out using electron impact, synchrotron radiation (including free electron lasers) and short wavelength lasers. Papers using photoemission and other techniques, in which synchrotron radiation, Free Electron Lasers, laboratory lasers or other sources of ionizing radiation, combined with electron velocity analysis are especially welcome. The materials properties addressed include characterization of ground and excited state properties as well as time resolved electron dynamics.
The individual techniques of electron spectroscopy include photoelectron spectroscopy of both outer and inner shells; inverse photoemission; spin-polarised photoemission; time resolved 2-photon photoemission, resonant and non-resonant Auger spectroscopy including ion neutralization studies; edge techniques (EXAFS, NEXAFS,...) , resonant and non-resonant inelastic X-ray scattering (RIXS), spectro-microscopy, high resolution electron energy loss spectroscopy; electron scattering and resonance electron capture; electron spectroscopy in conjunction with microscopy; penning ionization spectroscopy including scanning tunneling spectroscopy; theoretical treatments of the photoemission, X-ray emission, Auger, energy loss and Penning ionization processes. Contributions on instrumentation and technique development, date acquisition - analysis - quantification are also welcome.
Subject areas covered include spectroscopic characterization of materials and processes concerning:
- surfaces, interfaces, and thin films;
- atomic and molecular physics, clusters;
- semiconductor physics and chemistry;
- materials for photovoltaics;
- materials science including: metal surfaces, nanoparticles, ceramics, strongly correlated systems, polymers, biomaterials and other organic films;
- catalysis
Submission Guidelines:
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This page displays information about journals or magazines for reference and study purposes only. It is not the official website of any journal or magazine and does not involve publishing matters. Users must verify any publishing-related inquiries directly with the publisher.
If there are any issues with the content displayed on this page, please contact us at: [email protected], and we will verify and address the matter diligently.